Characterization of the genomic region containing a major QTL conditioning common bacterial blight resistance in common bean.
Citation
Liu, S., Yu, K., Banik, M., et Park, S.J. (2008). « Characterization of the genomic region containing a major QTL conditioning common bacterial blight resistance in common bean. », Annual Report of the Bean Improvement Cooperative (BIC), 51, p. 202-203.
Date de publication
2008-12-31