IDENTIFICATION OF MOLECULAR MARKERS LINKED TO RESISTANCE TO BACTERIAL WILT IN DRY BEAN
K.A. Kader, P.M. Balasubramanian, and S. Chatterton. Identification of molecular markers linked to resistance to bacterial wilt in dry bean. Canadian Pulse Research Workshop, Winnipeg MB, October 26 – 28, 2016. (poster presentation)
Dry bean (Phaseolus vulgaris L.) is a profitable pulse crop grown under irrigation in Alberta. Bacterial wilt (BW) caused by Curtobacterium flaccumfaciens pv. flaccumfaciens (Cff) can be a serious disease of dry bean. Yield loss due to BW could be 80% in severe conditions. Use of disease-free certified seed and disease resistant cultivars are the two best strategies to prevent bacterial wilt. Identification of resistant germplasm to BW and its use in dry bean improvement is important. However, understanding the genetic control of resistance to BW is difficult as it does not follow classical Mendelian genetics. Identification of resistance to BW in dry bean by molecular markers could be useful for selection. Two F7 recombinant inbred line populations derived from resistant X susceptible cross were inoculated and rated for phenotypic reactions. Genomic DNA was extracted from each RIL, PCR-amplified by SSR primers, and DNA banding pattern analysed on agarose gels. DNA fingerprinting was matched with corresponding phenotypic reactions to identify molecular markers linked to disease resistance.